SAKTHIVADIVEL, M; SARATHY, D; GAYATHRI, V; NAVEEN KUMAR, K. Advanced Operating System Vulnerability Scanner – DefenX. Applied Science and Engineering Journal for Advanced Research, [S. l.], v. 5, n. 2, p. 12–15, 2026. DOI: 10.54741/ASEJAR/5.2.2026.185. Disponível em: https://asejar.singhpublication.com/index.php/ojs/article/view/185. Acesso em: 22 jun. 2026.